PaperApplication of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samplesOliver C. Wells, Maurice McGlashan-Powell, et al.Scanning
PaperSchlieren method as applied to magnetic recording heads in the scanning electron microscopeOliver C. Wells, Matthias BrunnerApplied Physics Letters
PaperDiscussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)Oliver C. WellsMicroscopy and Microanalysis
PaperUse of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscopeOliver C. Wells, L. Gignac, et al.Scanning
