PaperFundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)Oliver C. WellsJournal of Microscopy
PaperReciprocity between the reflection electron microscope and the low-loss scanning electron microscopeOliver C. WellsApplied Physics Letters
PaperExamination of uncoated photoresist by the low-loss electron method in the scanning electron microscopeOliver C. Wells, Ping-Chin ChengJournal of Applied Physics
PaperIsolation of type-2 magnetic contrast in the SEM by a lock-in techniqueOliver C. WellsApplied Physics Letters
