Full-Wafer Technology—a New Approach To Large-Scale Laser Fabrication and Integration
- Peter Vettiger
- Gian-Luca Bona
- et al.
- 1991
- IEEE JQE
Publications
14 results for H.K. Seitz
Voltage detector and sub-micrometer focusing unit for photoemission probing
- R. Clauberg
- A. Blacha
- et al.
- 1990
- Review of Scientific Instruments
Full wafer technology for semiconductor lasers
- P. Buchmann
- M. Benedict
- et al.
- 1990
- LEOS 1990
Full wafer processing and testing-the future of large scale laser fabrication
- P. Vettiger
- M. Benedict
- et al.
- 1990
- ISLC 1990
Contactless, high-speed: Waveform measurements on gallium arsenide ICs
- H.K. Seitz
- A. Blacha
- et al.
- 1990
- IEEE Design and Test of Computers
Picosecond photoemission probing of integrated circuits. Capabilities, limitations, and applications
- R. Clauberg
- H. Beha
- et al.
- 1990
- IBM J. Res. Dev
Progress in photoemission sampling
- H. Beha
- R. Clauberg
- et al.
- 1989
- CompEuro 1989
Contactless high-speed waveform measurements on GaAs integrated circuits with the photoemission sampling technique
- H.K. Seitz
- A. Blacha
- et al.
- 1989
- European Test Conference 1989
Picosecond photoemission sampling for contactless high speed integrated circuit diagnostics
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
17ps rise-time measurement by photoemission sampling
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Electronics Letters