James H. Comfort, Rafael Reif
JES
This paper describes the first realization of a reduced-field design concept for advanced bipolar devices using the low-temperature epitaxial (LTE) technique to form the base layer. By inserting a lightly doped collector (LDC) spacer layer between the heavily doped base and collector regions, we have successfully demonstrated that the collector-base (CB) junction avalanche multiplication can be reduced substantially while maintaining high collector doping for current density consideration. Similar applications of the LDS technique to the emitter-base (EB) junction also result in a lower electric field, thus less EB junction reverse leakage. © 1990 IEEE
James H. Comfort, Rafael Reif
JES
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