Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
The atomic structure of the {001} surface of Ni3Al has been determined by LEED (low-energy electron diffraction) intensity analysis to correspond to simple truncation of the bulk structure with the Ni-Al mixed layer on top rather than the pure Ni layer. The first interlayer spacing is essentially equal to the bulk interlayer spacing between {001} planes. First-principles calculations of the cohesive energies of slabs terminating in the two types of layers also indicate that the mixed layer termination is more stable. © 1985.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
A. Krol, C.J. Sher, et al.
Surface Science
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999