P. Lindenfeld, H. Rohrer
Physical Review
Paper
Surface imaging by scanning tunneling microscopy
Abstract
We discuss the potential of a new technique for surface imaging on an atomic scale: scanning tunneling microscopy. Examples for 3D topographies of surfaces and work-function profiles are given. © 1983.
Related
G. Binnig, H. Rohrer
Surface Science
M.I. Lutwyche, C. Andreoli, et al.
MEMS 1998
H. Rohrer
Microelectronic Engineering