Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Structural investigations of the Co layer in Cu/Co/Cu/NiFe/FeMn spin valves have been performed by NMR. In addition to hcp stacking faults in an overall fcc structure, a significant amount of bulk defects, which may affect the magnetoresistance, is also present. The interface planes seem rather intermixed although they include some wide islands of pure elements. © 1993.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
David B. Mitzi
Journal of Materials Chemistry
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT