G.A. Held, D.M. Goodstein, et al.
Physical Review B
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
G.A. Held, D.M. Goodstein, et al.
Physical Review B
R.M. Feenstra, D.A. Collins, et al.
Superlattices and Microstructures
Joseph A. Stroscio, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
P.N. First, R.A. Dragoset, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films