M. Ree, K.-J. Chen, et al.
Journal of Applied Physics
Using a source of freely propagating subpicosecond pulses of THz radiation, we have measured the absorption and dispersion of both N- and P-type, 1 Ω cm silicon from 0.1 to 2 THz. These results give the corresponding frequency-dependent complex conductance over the widest frequency range to date. The data provide a complete view on the dynamics of both electrons and holes and are well fit by the simple Drude relationship.
M. Ree, K.-J. Chen, et al.
Journal of Applied Physics
D. Grischkowsky, Ming L. Yu, et al.
Surface Science
D. Grischkowsky
Applied Physics Letters
Martin Van Exter, Ch. Fattinger, et al.
Applied Physics Letters