Nathan Marchack, Marwan Khater, et al.
SPIE Advanced Lithography 2017
OFF-state modulation of the floating-body potential in partially depleted silicon-on-insulator (PDSOI) transistors from the 90-nm technology generation is observed using pulsed current-voltage (I-V) measurements. Varying the off-value of the gate voltage is shown to either decrease the transient on-current (Ion,trans) of PDSOI devices through gate-to-body leakage or increase Ion,trans due to gate-induced drain leakage. Dependence of Ion,trans on OFF-state gate bias is not observed in bulk devices, PDSOI devices with body contacts, or fully depleted SOI devices, confirming the role of floating-body in the observed effects. Thus, OFF-state conditions should be accounted for when considering floating-body effects and when using pulsed I-V measurements to study self-heating. © 2006 IEEE.
Nathan Marchack, Marwan Khater, et al.
SPIE Advanced Lithography 2017
Theodore G. Van Kessel, Ramachandran Muralidhar, et al.
Big Data 2017
Shireen Warnock, Rob Groves, et al.
CICC 2014
Leland Chang, David M. Fried, et al.
VLSI Technology 2005