PaperTop-down topography of deeply etched silicon in the scanning electron microscopeOliver C. Wells, Conal E. Murray, et al.Review of Scientific Instruments
PaperXY table and tilting stage for scanning electron microscope (SEM)Oliver C. WellsReview of Scientific Instruments
PaperMagnetically filtered low-loss scanning electron microscopyOliver C. Wells, Francoise K. LeGoues, et al.Applied Physics Letters
PaperFundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)Oliver C. WellsJournal of Microscopy
