PaperUse of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscopeOliver C. Wells, L. Gignac, et al.Scanning
PaperCollector turret for scanning electron microscopeOliver C. Wells, Conrad G. BremerReview of Scientific Instruments
PaperDiscussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)Oliver C. WellsMicroscopy and Microanalysis
PaperApplication of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samplesOliver C. Wells, Maurice McGlashan-Powell, et al.Scanning
