R.W. Gammon, E. Courtens, et al.
Physical Review B
The magnetic field dependence of the critical current of single YiBa2Cu307-8 grain boundary junctions has been measured as a function of temperature and orientation. A significant residual critical current is observed which increases with decreasing angle of misorientation at a given field and temperature. The data are in qualitative accord with a model in which the grain boundary comprises of a large number of micro-bridges in parallel. © 1993 IEEE
R.W. Gammon, E. Courtens, et al.
Physical Review B
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Technical Digest-International Electron Devices Meeting
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
P.C. Pattnaik, D.M. Newns
Physical Review B