Christoph S. Harder, Bart Van Zeghbroeck, et al.
IEEE Electron Device Letters
Some properties of NbNb oxide-PbIn edge junctions and two-junction superconducting interferometers have been measured. From the voltage of the resonance involving the junction capacitance and interferometer inductance, we deduce that the specific capacitance of 2.5 μm2 junctions having a current density of 30 kA cm-2 is 20±4 μF cm-2. © 1981.
Christoph S. Harder, Bart Van Zeghbroeck, et al.
IEEE Electron Device Letters
Heinz Jaeckel, Volker Graf, et al.
IEEE Electron Device Letters
Michel Despont, Gilles Beljakovic, et al.
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Peter Vettiger, Gian-Luca Bona, et al.
IEEE JQE