Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
A large enhancement of the parametrically generated backward-propagating elastic wave in Si: In is reported. The enhancement is observed when the nonlinear interaction between microwave electric and elastic fields occurs at the interface between the Si sample and the sputtered thin-film ZnO ultrasonic transducer. Phase and spectral information is presented. No satisfactory mechanism for the enhancement is known. © 1982 The American Physical Society.
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
Revanth Kodoru, Atanu Saha, et al.
arXiv
K.N. Tu
Materials Science and Engineering: A
J. Tersoff
Applied Surface Science