Conference paper
BEOL interconnects for 45 nm node and beyond
R.R. Yu, J. Doyle, et al.
VMIC 2005
Paper
Electron transport in Nb-Nb oxide-Bi tunnel junctions
Abstract
Two stable conduction states have been observed in tunnel junctions composed of Nb-Nb oxide-Bi. The conduction characteristics, including switching between the two states, are interpreted using a potential barrier model which is alterable by internal polarizations. © 1971.
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