SiGe Channel for Scaled Gate-All-Around Nanosheet pFET Transistor for Advanced Logic Applications
- Shogo Mochizuki
- Sushant Kumar
- et al.
- 2025
- IEDM 2025
James Demarest
Title
Physical Characterization
Bio
J. has authored or co-authored more than 70 papers and 45 patents in semiconductors, microscopy, and characterization techniques. He has held adjunct faculty positions at Rensselaer Polytechnic Institute (RPI) in Troy, NY USA. J. is a Past President of Electronic Device Failure Analysis Society and a Fellow of ASM International.
Publications
Monolithic Stacked FET with Stepped Channels for Future Logic Technologies
- Chen Zhang
- Seungmin Song
- et al.
- 2024
- IEDM 2024
Phase Change Memory-based Hardware Accelerators for Deep Neural Networks
- Geoffrey Burr
- Pritish Narayanan
- et al.
- 2023
- VLSI Technology 2023
Hardware Based Performance Assessment of Vertical-Transport Nanosheet Technology
- Gen Tsutsui
- Seunghyun Song
- et al.
- 2022
- IEDM 2022
Optimization of Interfacial PCM Layers to Enable High Resistance Doped PCM in Mushroom Cell Devices for Analog Computing
- Kevin Brew
- Injo Ok
- et al.
- 2022
- MRS Fall Meeting 2022
Patents
- CN
- ZL201980028141.5
- US
- 11876023
- JP
- 7304116
- US
- 11263059
- US
- 11113533
- US
- 11005646
- US
- 10658154
- US
- 10566414
- US
- 10546813
- US
- 10528817
Top collaborators
HB
Huiming Bu
Vice President: IBM Semiconductors Global R&D and Albany Operations
VN
Vijay Narayanan
IBM Fellow, Semiconductor Pathfinding
NS
Nicole Saulnier
Senior Research Manager, On-prem AI Cloud Delivery
KB
Kevin Brew
Senior Semiconductors Hardware Engineer of Materials R&D for Chiplet, Logic, and AI