Publications

307 results at IEEE Electron Device Letters

Anomalous Narrow Channel Effect in Trench-Isolated Buried-Channel P-MOSFET‘s
- - J.A. Mandelman
  - J. Alsmeier
- 1994
- IEEE Electron Device Letters
Experimental High Performance Sub-0.1 μm Channel nMOSFET's
- - Y. Mii
  - S. Rishton
  - et al.
- 1994
- IEEE Electron Device Letters
An Epitaxial Emitter-Cap SiGe-Base Bipolar Technology Optimized for Liquid-Nitrogen Temperature Operation
- - John D. Cressler
  - Emmanuel F. Crabbé
  - et al.
- 1994
- IEEE Electron Device Letters
On the Effects of Hydrogen in p-n-p Transistors under Forward Current Stress in a C-BiCMOS Technology
- - J.Y.C. Sun
  - Maw-Rong Chin
- 1993
- IEEE Electron Device Letters
Arsenic Source and Drain Implant Induced Degradation of Short-Channel Effects in NMOSFETs
- - Alexandre Acovic
  - Devendra K. Sadana
  - et al.
- 1993
- IEEE Electron Device Letters
Optimized Silicon-Rich Oxide (SRO) Deposition Process for 5-V-Only Flash EEPROM Applications
- - Leonello Dori
  - Alexandre Acovic
  - et al.
- 1993
- IEEE Electron Device Letters
High-Performance Si/SiGe n-Type Modulation-Doped Transistors
- - Khaled Ismail
  - S. Rishton
  - et al.
- 1993
- IEEE Electron Device Letters
Experimental 0.1-um p-Channel MOSFET with p⁺-Polysilicon Gate on 35-A Gate Oxide
- - Yuan Taur
  - S. Cohen
  - et al.
- 1993
- IEEE Electron Device Letters
Current Gain Rolloff in Graded-Base SiGe Heterojunction Bipolar Transistors
- - Emmanuel F. Crabbé
  - John D. Cressler
  - et al.
- 1993
- IEEE Electron Device Letters
A Model for Anomalous Short-Channel Behavior in Submicron MOSFET’s
- - H.I. Hanafi
  - Y. Lii
  - et al.
- 1993
- IEEE Electron Device Letters