Publications

5 results for Jae-Eun Park

Transistor mismatch properties in deep-submicrometer CMOS technologies
- - Xiaobin Yuan
  - Takashi Shimizu
  - et al.
- 2011
- IEEE T-ED
Gate-induced-drain-leakage current in 45-nm CMOS technology
- - Xiaohin Yuan
  - Jae-Eun Park
  - et al.
- 2008
- IEEE T-DMR
Characterization and analysis of gate-induced-drain-leakage current in 45 nm CMOS technology
- - Xiaobin Yuan
  - Jae-Eun Park
  - et al.
- 2007
- IIRW 2007
Modeling MOSFET process variation using PSP
- - Josef Watts
  - Yoo-Mi Lee
  - et al.
- 2007
- NSTI-Nanotech 2007
High performance thick copper inductors in an RF technology
- - Kunal Vaed
  - William Graham
  - et al.
- 2004
- SPIE Micromachining and Microfabrication 2004