Challenges and solutions of FinFET integration in an SRAM cell and a logic circuit for 22 nm node and beyond
- H. Kawasaki
- V.S. Basker
- et al.
- 2009
- IEDM 2009
Publications
14 results for Chung-Hsun Lin
Performance-aware corner model for design for manufacturing
- Chung-Hsun Lin
- Mohan V. Dunga
- et al.
- 2009
- IEEE Transactions on Electron Devices
VDD scaling for FinFET logic and memory circuits: The impact of process variations and SRAM stability
- C.-H. Lin
- K. Das
- et al.
- 2006
- VLSI-TSA 2006
Compact modeling of FinFETs featuring independent-gate operation mode
- C.-H. Lin
- X. Xi
- et al.
- 2005
- VLSI Technology 2005