Zeitschrift fur Naturforschung - Section A Journal of Physical Sciences

Paper

02 Jun 2014

Zur Röntgen-Fluoreszenz-Analyse dünner Legierungsschichten

Abstract

No abstract available.

Paper

High resolution X-ray diffraction from small numbers of Langmuir-Blodgett layers of manganese stearate

M. Pomerantz, Armin Segmüller

Thin Solid Films

Paper

Oriented growth of ultrathin tungsten films on sapphire substrates

J.H. Souk, Armin Segmüller, et al.

Journal of Applied Physics

Paper

Characterization of epitaxial (Ca,Ba)F₂ films on Si(111) substrates

M. Wittmer, D.A. Smith, et al.

Applied Physics Letters

Paper

Automatic x-ray diffraction measurement of the lattice curvature of substrate wafers for the determination of linear strain patterns

Armin Segmüller, J. Angilelo, et al.

Journal of Applied Physics

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