Pritish Narayanan, Stefano Ambrogio, et al.
IEEE T-ED
We discuss inline electrical testing to monitor the baseline of Analog Computing hardware using Phase Change Memory (PCM) technology. Tightening the PCM resistance distribution is necessary to meet analog computation requirement. A new yield methodology is introduced. A study of heater process variation, which will affect the heater height and the PCM resistance, will be discussed.
Pritish Narayanan, Stefano Ambrogio, et al.
IEEE T-ED
Sathya Raghavan, Hiroyuki Mori, et al.
ECTC 2023
Manuel Le Gallo
PASC 2025
Tommaso Stecconi, Roberto Guido, et al.
Advanced Electronic Materials