PaperHardness assurance for proton direct ionization-induced SEEs using a high-energy proton beamNathaniel A. Dodds, James R. Schwank, et al.IEEE TNS
Conference paperInAs bipolar transistors: A path to high-performance cryogenic electronicsP.E. Dodd, M.R. Melloch, et al.Device Research Conference 1993
PaperPhotoemission spectroscopy of Al0.27Ga0.73As:As photodiodesD.T. McInturff, J. Woodall, et al.Applied Physics Letters
PaperNew Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy StraggleN.A. Dodds, P.E. Dodd, et al.IEEE TNS
