PaperOn-chip circuit to monitor long-term NBTI and PBTI degradationKeith A. Jenkins, Pong-Fei LuMicroelectronics Reliability
PaperReduction of Hot Carrier Degradation of FinFETs Due to Short-Pulse StressKeith A. Jenkins, Barry P. LinderIEEE Electron Device Letters
Conference paperHigh-frequency performance of graphene field effect transistors with saturating IV-characteristicsInanc Meric, Cory R. Dean, et al.IEDM 2011
PaperSpiral inductors and transmission lines in silicon technology using copper-damascene interconnects and low-loss substratesJoachim N. Burghartz, Daniel C. Edelstein, et al.IEEE T-MTT
