U. Dürig, D. Pohl, et al.
Journal of Applied Physics
Paper
"Tracking" tunneling microscopy
Abstract
Simple modification of the electronics of a STM allows operation in various tracking modes. Profiles of steepest inclination, equal height, equipotential, electrical field lines, etc., can be traced out. The tunnel tip can also be locked to a surface extremity for indefinite time. Some of these possibilities were tested experimentally.
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