Conference paper
New scanning probe microscopies: status and prospects
D. Pohl
Institute of Physics Electron Microscopy and Analysis Group Conference 1991
Simple modification of the electronics of a STM allows operation in various tracking modes. Profiles of steepest inclination, equal height, equipotential, electrical field lines, etc., can be traced out. The tunnel tip can also be locked to a surface extremity for indefinite time. Some of these possibilities were tested experimentally.
D. Pohl
Institute of Physics Electron Microscopy and Analysis Group Conference 1991
D. Pohl, S.E. Schwarz, et al.
Physical Review Letters
H. Heinzelmann, Th. Lacoste, et al.
Thin Solid Films
D. Pohl, W. Denk, et al.
Applied Physics Letters