A. Reisman, M. Berkenblit, et al.
JES
We report the characterization of thin films of MoO3 and their implementation on a micromachined silicon-based structure to achieve considerably low power consumption. The sensing layer is capable of detecting NO2 up to a few ppm with considerably short response and recovery times. Investigation of structural features of the films is carried out by X-ray diffraction and electron microscopy. © 1998 Elsevier Science S.A. All rights reserved.
A. Reisman, M. Berkenblit, et al.
JES
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures