Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Measurements of thermoelectric power versus temperature of (CH)x doped with various concentrations of AsF5 are reported. These reflect the semiconductor-metal transition at ∼ 1% doping. The "pristine" thermopower is consistent with the conductivity-derived activation energy of 0.35 eV, and a residual defect/impurity carrier concentration of 0.1%. An analysis of the conductivity based on these data indicates that, while the disorder is certainly important, it is not the cause of the transition. © 1980.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules
A. Gangulee, F.M. D'Heurle
Thin Solid Films
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999