J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
Measurements of thermoelectric power versus temperature of (CH)x doped with various concentrations of AsF5 are reported. These reflect the semiconductor-metal transition at ∼ 1% doping. The "pristine" thermopower is consistent with the conductivity-derived activation energy of 0.35 eV, and a residual defect/impurity carrier concentration of 0.1%. An analysis of the conductivity based on these data indicates that, while the disorder is certainly important, it is not the cause of the transition. © 1980.
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
T.N. Morgan
Semiconductor Science and Technology
R. Ghez, J.S. Lew
Journal of Crystal Growth