A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Near edge X-ray adsorption fine structure (NEXAFS) data have been used to determine the orientation of 2,5-dihydrothiophene on Mo(110)-(4 × 1)-S at saturation coverage (θ ∼ 0.3). The C;CCC plane is nearly perpendicular to the surface, tilting ∼ 9° away from surface normal based on an analysis of the polarization dependence of the C(1s) → π* resonance intensity. Furthermore, the π* resonance is very sharp indicating that the CC bond does not interact significantly with the molybdenum surface. The NEXAFS data corroborate earlier conclusions regarding the ring orientation and lack of π bonding with the surface derived from high resolution electron energy loss data. © 1993.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
Mitsuru Ueda, Hideharu Mori, et al.
Journal of Polymer Science Part A: Polymer Chemistry