J.M.E. Harper, C. Cabral Jr., et al.
Annual Review of Materials Science
Texture formation in Ti-Ta alloy thin films on Si(001) and polysilicon substrates, was investigated using in situ and ex situ x-ray diffraction. Diffraction patterns were collected every 0.5 s during phase transformation kinetic studies. Results indicated that the addition of Ta enhanced the C49-C54 phase transition and changed the preferred orientation of C54 TiSi2 film. In situ and ex situ results showed that at 6 at.% Ta concentration, films on Si(001) and polysilicon developed a strongly oriented C54(010) texture along the sample normal.
J.M.E. Harper, C. Cabral Jr., et al.
Annual Review of Materials Science
K. Barmak, A. Gungor, et al.
MRS Proceedings 2002
L. Clevenger, R. Mann, et al.
Journal of Applied Physics
J.-S. Chun, P. Desjardins, et al.
Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films