PaperStructure analysis of Si(111)2 1 with low-energy electron diffractionF.J. Himpsel, P.M. Marcus, et al.Physical Review B
PaperStrain relaxation in ultrathin epitaxial films of β-FeSi2 on unstrained and strained Si(100) surfacesD.R. Peale, R. Haight, et al.Thin Solid Films
PaperTheory and simulation of high-energy ion scattering experiments for structure analysis of surfaces and interfacesJ.W.M. Frenken, R.M. Tromp, et al.Nuclear Inst. and Methods in Physics Research, B
PaperDesign of a new photo-emission/low-energy electron microscope for surface studiesR.M. Tromp, M.C. ReuterUltramicroscopy
