Rajiv V. Joshi, Keunwoo Kim, et al.
IEEE International SOI Conference 2003
This paper describes advanced Integrated-Schottky-Logic (ISL) circuits featuring double-poly self-alignment, “free” epi-base lateral p-n-p clamp, Selfaligned guard ring Schottky barrier diode, and silicon-filled trench isolation. Using a 0.7-µm-thick epitaxial layer and 1.2-µm minimum dimensions, gate delays of 432 ps (fan-out = 1) and 527 ps (fan-out = 3) are obtained at current levels of 183 and 255 µA/gate, respectively, with nonwalled emitter. With walled emitter (two sides), a gate delay of 382 ps is achieved for fan-out of 3 at a current level of 267 μA/gate. © 1986 IEEE
Rajiv V. Joshi, Keunwoo Kim, et al.
IEEE International SOI Conference 2003
Rajiv V. Joshi, Saibal Mukhopadhyay, et al.
ESSCIRC 2004
L.K. Wang, G.P. Li, et al.
ECS Meeting 1984
Jente B. Kuang, Ching-Te Chuang
IEEE TCAS-II