Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Review
Spectroscopy with the scanning tunnelling microscope: A critical review
Abstract
The author discusses the use of the scanning tunnelling microscope as a spectroscopic tool. Several methods of obtaining spectroscopic information are reviewed. The strengths and weaknesses of scanning tunnelling microscopy are discussed in comparison with more conventional surface spectroscopy techniques.
Related
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery