R.B. Laibowitz, R.P. Robertazzi, et al.
Physical Review B
We have simultaneously measured the surface topography and the tunneling current-voltage (I-V) characteristics of thin films of NbN as a function of lateral position using a low-temperature scanning tunneling microscope. We have imaged the superconducting energy gap by fitting the I-V's with an energy gap for each spatial position. Such images showed significant variation of the gap, including areas with reduced gap when a magnetic field (up to 6 T) was applied. The features in the gap image were often correlated with features in the surface topographic images.
R.B. Laibowitz, R.P. Robertazzi, et al.
Physical Review B
J. Mannhart, H. Hilgenkamp, et al.
J. Phys. IV
B.G. Briner, R.M. Feenstra, et al.
Semiconductor Science and Technology
R.M. Feenstra, M.A. Lutz
Physical Review B