W. Baechtold, Th. Forster, et al.
Electronics Letters
Si and GaAs Schottky-barrier field-effect transistors with gate lengths of 0.5 µm have been experimentally realised. Noise and gain properties were measured in the microwave range up to 20 GHz. When compared with 1 µm-gate f.e.t.s, the devices show considerable improvements in gain and in noise figure. At 10 GHz, the following values were measured: Si m.e.s.f.e.t.: maximum available gain = 5.9 dB, noise figure = 5.8 dB; GaAs m.e.s.f.e.t.: maximum available gain = 12.8 dB, noise figure = 3.7 dB. © 1973, The Institution of Electrical Engineers. All rights reserved.
W. Baechtold, Th. Forster, et al.
Electronics Letters
W. Baechtold
Electronics Letters
P. Guéret, P. Buchmann, et al.
Applied Physics Letters
W. Baechtold, P. Wolf
Solid-State Electronics