William R. Hunter, Linda Ephrath, et al.
IEEE JSSC
The group VA element P and the group IA elements Li and Na give rise to shallow acceptor centers in ZnTe and in CdTe. An analysis of the carrier concentration data for Li-doped ZnTe and P-doped ZnTe on the basis of a single-level acceptor and nondegenerate statistics indicates that P and Li produce shallow, hydrogenic-type acceptor levels in ZnTe. Annealing studies demonstrate that the shallow levels in Li-doped ZnTe and CdTe may be removed by heat treatment at 250°C for tens of hours. The concentrations of shallow acceptors in P-doped ZnTe and Na-doped ZnTe are relatively unchanged by the annealing procedure. The effective mass for holes in ZnTe as deduced from the Hall analysis is 0.36m, where m is the free-electron mass. © 1966 The American Physical Society.
William R. Hunter, Linda Ephrath, et al.
IEEE JSSC
Billy L. Crowder, R.S. Title, et al.
Physical Review
Billy L. Crowder
JES
Billy L. Crowder
JES