Keith A. Jenkins, Byungdu Oh
Journal of Applied Physics
Self-heating of FinFET transistors is a reliability concern, especially for large devices with dense arrays of fins on Silicon On Insulator. In this paper, device-level temperature measurements acquired using an optical technique are presented. The 2-D time-resolved emission measurements through the substrate are used to monitor the temperature-dependent modulation of the OFF-state leakage current of individual transistors, noninvasively and with high time accuracy. Different device geometries and operating conditions are evaluated and compared.
Keith A. Jenkins, Byungdu Oh
Journal of Applied Physics
Jianshi Tang, Qing Cao, et al.
Nature Electronics
Yanqing Wu, Keith A. Jenkins, et al.
Nano Letters
Damon B. Farmer, Hsin-Ying Chiu, et al.
Nano Letters