Conference paper
Extremely thin SOI (ETSOI) technology: Past, present, and future
Kangguo Cheng, A. Khakifirooz, et al.
IEEE International SOI Conference 2010
In this letter, we report self-aligned n-channel germanium (Ge) MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate electrode. Excellent off-state current is achieved through the reduction of junction leakage. For the first time, we have demonstrated an n-channel Ge MOSFET with a subthreshold slope of 150 mV/dec and an on-off current ratio of ∼10 4.
Kangguo Cheng, A. Khakifirooz, et al.
IEEE International SOI Conference 2010
Tenko Yamashita, Veeraraghvan S. Basker, et al.
VLSI Technology 2011
Takeshi Nogami, Tibor Bolom, et al.
IEDM 2010
Yue Kuo, P. Kozlowski
Applied Physics Letters