Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
The concepts employed and models referred to in discussing metal-semiconductor interfaces are briefly discussed. The current status of experimental studies of a few such systems is examined. We emphasize the necessity of distinguishing between different possible mechanisms involved in determining the properties of these interfaces, and point out that the current experimental results seem consistent with diverse models of these interfaces. © 1983.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Mark W. Dowley
Solid State Communications
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures