A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
An overview of the status of Scanning Tunneling Microscopy (STM) is given. So far, the method has been applied mainly to surface structures. Examples are given for reconstructions on metal and semiconductor surfaces and adsorbate structures. It will become evident that the technique is likewise applicable to chemical investigations of surfaces on an atomic scale. © 1985.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
David B. Mitzi
Journal of Materials Chemistry
Ronald Troutman
Synthetic Metals
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989