Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
The study of self-testing and self-correcting programs leads to the search for robust characterizations of functions. Here the authors make this notion precise and show such a characterization for polynomials. From this characterization, the authors get the following applications. Simple and efficient self-testers for polynomial functions are constructed. The characterizations provide results in the area of coding theory by giving extremely fast and efficient error-detecting schemes for some well-known codes. This error-detection scheme plays a crucial role in subsequent results on the hardness of approximating some NP-optimization problems.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Alessandro Morari, Roberto Gioiosa, et al.
IPDPS 2011
David S. Kung
DAC 1998
Heinz Koeppl, Marc Hafner, et al.
BMC Bioinformatics