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Journal of Electronic Materials
Data on resistivity at room temperature in polycrystalline and single-crystal Permalloy (80 Ni-20 Fe) thin films are analyzed in terms of grain boundary scattering and the dc size effect, respectively. © 1974 American Institute of Physics.
F.M. d'Heurle, A. Gangulee, et al.
Journal of Electronic Materials
P. Chaudhari, A. Gangulee
Scripta Metallurgica
A.F. Mayadas, R.B. Laibowitz, et al.
Journal of Applied Physics
J.F. Janak, A.R. Williams
Physical Review B