Solid State Electronics

Paper

01 Jan 1993

Reduced hot-carrier reliability degradation of x-ray irradiated MOSFETs in a 0.25 μm CMOS technology with ultra-thin gate oxide

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Abstract

No abstract available.

Paper

Characterization of large magnetic anisotropies in (100)- and (111)-oriented Co/Pt multilayers by Brillouin light scattering

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Journal of Magnetism and Magnetic Materials

Conference paper

Interface state generation in pFETs with ultra-thin oxide and oxynitride on (100) and (110) Si substrates

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INFOS 2005

Paper

Silylation of resist materials using di- and polyfunctional organosilicon compounds

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Microelectronic Engineering

Paper

Studies of Chain Conformational Kinetics in Poly(di-n-alkylsilanes) by Spectroscopic Methods. 4. Piezochromism in Symmetrical Poly(di-n-alkylsilanes)

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Macromolecules

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