PaperAutomated analysis of evolving interfaces during in situ electron microscopyNicholas M. Schneider, Jeung Hun Park, et al.ASCI
PaperControl of Growth Front Evolution by Bi Additives during ZnAu ElectrodepositionJeung Hun Park, Nicholas M. Schneider, et al.Nano Letters
PaperAutomated analysis of evolving interfaces during in situ electron microscopyNicholas M. Schneider, Jeung Hun Park, et al.ASCI
PaperBubble and pattern formation in liquid induced by an electron beamJoseph M. Grogan, Nicholas M. Schneider, et al.Nano Letters
