Conference paperCMOS IC diagnostics using the luminescence of OFF-state leakage currentsStas Polonsky, Keith A. Jenkins, et al.IEEE ITC 2004
PaperSiGe power HBT's for low-voltage, high-performance RF applicationsJoachim N. Burghartz, Jean-Olivier Plouchart, et al.IEEE Electron Device Letters
PaperAC device variability in high-κ Metal-Gate CMOS TechnologyKeith A. Jenkins, Karthik Balakrishnan, et al.IEEE Electron Device Letters
