Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
A measurement concept based on a two-port vector network analyzer has been developed, which enables pure-mode on-wafer measurements of differential circuits in the millimeter-wave frequency range. An error model for the measurement system is derived as required for future calibration algorithms. Based on WR15 waveguide components, together with 1.85-mm coaxial probes, a setup has been built and its amplitude and phase imbalances have been characterized in the frequency range from 50 to 65 GHz. © 2005 IEEE.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures