P.O. Jubert, R. Allenspach, et al.
Physical Review B - CMMP
Paper
Probing depth of threshold photoemission electron microscopy
Abstract
Probing depth of threshold photoemission electron microscopy was discussed. Photon excitation energies of 5 eV were studied. The mechanism responsible for bulk sensitivity was also studied. It was found that the probing depth is of 16.2 nm.
Related
A. Vanhaverbeke, A. Bischof, et al.
Physical Review Letters
P.O. Jubert, M. Kläui, et al.
Journal of Applied Physics
Conference paper
Current induced modifications of domain wall
P.O. Jubert, M. Kläui, et al.
INTERMAG 2005