Lijun Jiang, Seshadri Kolluri, et al.
EPEPS 2008
In this paper, the effect of metal roughness on the total loss, the extracted tan δ, and signal integrity of typical interconnections found in printed-circuit boards is extracted from measurements on three different materials. The differing characteristics of the roughened metal cross sections are highlighted, and a simplified, practical, 2-D, causal, broadband modeling methodology is shown. © 2007 IEEE.
Lijun Jiang, Seshadri Kolluri, et al.
EPEPS 2008
Da-Yuan Shih, Helen L. Yeh, et al.
IEEE Transactions on Components, Hybrids, and Manufacturing Technology
Jianyong Xie, Daehyun Chung, et al.
3DIC 2009
Alina Deutsch, Roger S. Krabbenhoft, et al.
IEEE Trans Electromagn Compat