Precision, double XTEM sample preparation of site specific Si nanowires

C.-K. Hu, K.Y. Lee, et al.

Thin Solid Films

P. DeHaven, K.P. Rodbell, et al.

MRS Spring Meeting 1999

C.-K. Hu, J. Ohm, et al.

Journal of Applied Physics

S. Cohen, J.C. Liu, et al.

MRS Spring Meeting 1999