Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Based on UV measurements at 157 nm of in-house fluoropolymers we have selected α-trifluoromethylacrylate and norbornene beating a pendant hexafluoroisopropanol group as our building blocks for 157 nm resist polymers. Polymers consisting of these repeat units have an optical density/μm of 3 or below at 157 nm. We have found that the α-trifluoromethylacrylate derivatives conveniently undergo radical copolymerization with norbornenes, which has provided a breakthrough in preparation of our 157 nm resist polymers. This approach offers flexibility and versatility because an acidic moiety or acid-labile group can be placed in either acrylate or norbornene repeat unit. Other platforms of interest include all-acrylic, all-norbornene, and acrylic-styrenic polymers. © 2001 SPIE - The International Society for Optical Engineering.
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Ronen Feldman, Martin Charles Golumbic
Ann. Math. Artif. Intell.
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
Martin Charles Golumbic, Renu C. Laskar
Discrete Applied Mathematics