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PaperPercolation of a simulated metallic film on a porous substrate: The copper-polyimide interfaceB.D. Silverman, D.E. PlattPhysical Review E
Conference paperDiagnosis and characterization of timing-related defects by time-dependent light emissionD.R. Knebel, P.N. Sanda, et al.IEEE ITC 1998
Conference paperDesign and implementation of high performance dynamic 64-bit parallel adder with enhanced testabilityW. Hwang, G.D. Gristede, et al.CICC 1998